Opto-Electrical Device Characterization Laboratory
Optoelectronic Device Characterization Laboratory infrastructure is suitable for measuring significant quantities of the device optoelectronic behaviour such as photocurrent, quantum efficiency, spectral response optical response speed and many others.
Juan de la Cierva Fellow
Ahmed Esmail Shalan worked as a researcher at Central Metallurgical R&D Institute, Egypt after finishing his PhD. He had obtained his PhD (2017) from the Research Institute for Electronic Science, Hokkaido University, Japan, in the group of Prof. Dr. Hiroaki Misawa with the collaboration of Prof. Dr. Eric Diau -NCTU- Taiwan. It worth to mention that he got a prize during his Ph.D. as the best thesis at the graduate school of information science and technology, Hokkaido university and Ministry of Education Prize. Before he joined Hokkaido University he obtained a fellowship at DAAD visiting scholar internship in (i-MEET-FAU), Erlangen, Germany with Prof. Christoph J. Brabec and CIN2, UAB, Barcelona, Spain with Prof. Monica Lira Cantu. He published almost 30 papers in prestige journals (with h index of 14). Besides, he is an active reviewer for several journals (such as Electrochimica Acta, Journal of Alloys and Compounds, RSC Advances, etc.), a member in the editorial board of different prestigious publishers and have been invited to write several reviews and books chapters and have already published 6 book chapters. Also, he has been invited to give talks in conferences and Institutes.
Interests and objectives:
- Quantum Efficiency measurement
- J-V measurements
- Impedance analysis
- Spectral and Optical response