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Opto-Electrical Device Characterization Laboratory

Optoelectronic Device Characterization Laboratory infrastructure is suitable for measuring significant quantities of the device optoelectronic behaviour such as photocurrent, quantum efficiency, spectral response optical response speed and many others.

Lab. Manager

Juan de la Cierva Fellow

Ahmed Esmail Shalan worked as a researcher at Central Metallurgical R&D Institute, Egypt after finishing his PhD. He had obtained his PhD (2017) from the Research Institute for Electronic Science, Hokkaido University, Japan, in the group of Prof. Dr. Hiroaki Misawa with the collaboration of Prof. Dr. Eric Diau -NCTU- Taiwan. It worth to mention that he got a prize during his Ph.D. as the best thesis at the graduate school of information science and technology, Hokkaido university and Ministry of Education Prize. Before he joined Hokkaido University he obtained a fellowship at DAAD visiting scholar internship in (i-MEET-FAU), Erlangen, Germany with Prof. Christoph J. Brabec and CIN2, UAB, Barcelona, Spain with Prof. Monica Lira Cantu. He published almost 30 papers in prestige journals (with h index of 14). Besides, he is an active reviewer for several journals (such as Electrochimica Acta, Journal of Alloys and Compounds, RSC Advances, etc.), a member in the editorial board of different prestigious publishers and have been invited to write several reviews and books chapters and have already published 6 book chapters. Also, he has been invited to give talks in conferences and Institutes.

Interests and objectives:
I have a strong background in chemistry, nanotechnology and materials science. Also, I have a sufficient experience in the field of materials and processes for applications in energy and photonics, with emphasis on halide perovskites. In addition, my experience with fabrication and characterization of solution-processed perovskite-based solar cells devices is shown through my publications.

X-Ray difractogram (XRD), X-Ray photoelectron spectroscopy (XPS), Atomic force microscopy (AFM), Optical measurements (J-V curves, Quantum efficiency (QE), Impedance Spectroscopy (EIS), Scanning electron microscopy (SEM), fabrication of solar cell devices (dye, organic and pervoskite based).

  • Quantum Efficiency measurement
  • J-V measurements
  • Impedance analysis
  • Spectral and Optical response

The PVE300 is a turnkey solution for the determination of solar cell spectral response/

EQE (IPCE) and IQE. A range of options include mounts for substrate, superstrate or packaged devices, integrating sphere accessory for measurements of total reflectance and transmittance, a choice of single or multiple channel bias sources, including an AM1.5 matched bias source and a motorised XY stage for device mapping.

Fabrication step: Micro and nano fabrication
Purpose: Characterization of solar cell spectral response/EQE (IPCE) and IQE.
Material systems: Polymers, organics, dielectrics, metals and semiconductors
Node: Materials
Specifications/resolution: The standard spectral range of 300-1100nm, may be extended to 1800 nm and beyond

SP-300 is a 500 mA to 10 A state-of-the-art research grade potentiostat/galvanostat/EIS with remarkable specifications such as 7 mHz max frequency, floating mode, analog filtering, built-in calibration board, and stability bandwidths.

The SP-300’s modular chassis accept an optional high current/high voltage option board.

Alternatively, the SP-300 can accept a second potentiostat board (either standard or EIS) and perform as a Bipotentiostat to perform RRDE experiment. It is also a multiple user system as each channel board can be used independently by two different researchers.

Fabrication step: Micro and nano fabrication
Purpose: Electronic characterization of solar cell devices as well as organic material.
Material systems: Polymers, organics, dielectrics, metals and semiconductors
Node: Materials

  • Up to 2 channels
  • Compliance: ±12 V up to ±49 V with booster
  • Control voltage: ±10 V up to ±48 V with booster
  • Potential resolution: 1 µV
  • EIS measurement: 10 μHz – 3 MHz (1%, 1°), 10 μHz – 7 MHz (3%, 3°)
  • EIS quality indicators
  • Current ranges: 1 A to 10 nA (standard)
  • Maximum current: ±500 mA (standard)
  • Current resolution: 760 fA (standard)
  • Low current: 6 ranges from 100 nA to 1 pA with resolution to 76 aA
  • Floating mode
  • Analog filtering
  • Calibration board
  • Full stability control mode (9 bandwidths)
Bio Logic Science Instruments-SP-300 2017

A Solar Simulator is a light source that approximates the illumination of natural sunlight. Solar simulators with various tailored spectral output are used to to test a variety of samples including but not limited to solar cells, sun screen (SPF), materials photo-stability, and other samples (in-vivo or in-vitro) under controlled, repeatable, laboratory conditions.

Fabrication step: Micro and nano fabrication
Purpose: J-V curves of solar cell devices as well as long-term stability test under illumination.
Material systems: Polymers, organics, dielectrics, metals and semiconductors
Node: Materials
Specifications/resolution: Factory certified Class AAA CW solar simulator

Newport Oriel-SOL 3A Class AAA (2"x2") 2017

The Ossila Four-Point Probe System offers the following benefits for your research:

  • Wide range of sheet resistance measurements from 10 mΩ/□ to 10 MΩ/□
  • Protect fragile samples from damage with the spring-loaded probes
  • Compact size enables use in busy labs with limited space
  • Easy-to-use PC software with sheet resistance, resistivity, & conductivity measurements
  • Faster material characterisation with automatic correction factor calculation
  • Measurements can be repeated easily with saved settings

Fabrication step: Micro and nano fabrication
Purpose: Rapid measurement of sheet resistance, resistivity, and conductivity of materials.
Material systems: Polymers, organics, dielectrics, metals and semiconductors
Node: Materials